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CrossCheck Laser Sensor

Affordable CrossCheck Laser Profile Sensors

Use CrossCheck for faster startups and changeovers while reducing product scrap and rework. Easily diagnose root causes of product variation to improve dimensional quality and operator variability, enabling 100% product certification.

  • High Resolution laser profile sensors at a low cost
  • Off the shelf pre-calibrated 2D/3D laser measurement system
  • Small compact sensors for easy alignment and installation
  • Measure radius/diameter, height, width, angle, location and more …

Online or Offline … Crosscheck saves valuable time and money

  • Specifications
  • Dimensions

CrossCheck System Specifications (mm):

  CrossCheck Sensor Model
  Specification CC3100-30 CC3100-50 CC3100-100
Y-Axis Height Range 30 mm 50 mm 100 mm
Height Resolution* 0.003 mm 0.005 mm 0.010 mm
Height Accuracy* 0.015 mm 0.025 mm 0.050 mm
X-Axis Mid Width Range 30 mm 50 mm 100 mm
Near/Far Width Range 25 mm/35 mm 42 mm/58 mm 85 mm/115 mm
Width Resolution* 0.010 mm 0.015 mm 0.030 mm
Width Accuracy* 0.030 mm 0.050 mm 0.100 mm
General Max Profile Rate 30 fps
Laser Class 685nm, 3R
Weight Sensor: 2 kg (4.5 lbs.); Controller 6 kg (13.22 lbs.)
Controller Power 18VDC to 28VDC (phoenix power plug)
External AC Adapter: 90VAC to 264VAC, 47–63 Hz
Controller to Sensor Interface IEEE 1394b (Firewire)
Host Connectivity Gigabit Ethernet [Text via TCP/IP (Telnet)]
Environment Thermal Stability < .03% / °C
Operating Temperature 5–45 °C
Operating Humidity 5 … 95% (no condensation)
Shock (IEC 68-2-29) 15 g / 6ms
Vibration (IEC 68-2-6) 5 g, 58 … 150 Hz
Enclosure Rating IP-64
*Notes:
  1. Resolution and Accuracy are based on using a Diameter Shape Tool to locate the X,Y center point of a cylinder target whose radius is 10% or more of the sensor width range.
  2. Accuracy is +/- maximum expected deviation from the true value. The reference measurement is the difference between the location of a cylinder in position 1 and position 2. Confidence interval is 95%.
  3. Resolution is 1 standard deviation of 30 sequential measurements on a static target.

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